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Bond Testing

NDT Instruments / Bond Testing
BondScan

BondScan™:Bond Testing Instrument

BondScan™ instrument is designed for the inspection of multilayer material commonly used in the aerospace industry. The BondScan™ can perform Resonance inspection to detect disbonds, delaminations and thinner parts with a wide frequency band.

BondScan™ is compatible with most commercially available resonance probes and is specifically designed for scanning applications.
At the heart of this solution is TecView® BT, a state-of-the-art bond testing software that enables the user to quickly acquire data and perform advanced C-Scan analysis.

Computer controlled fully digital Bond Testing instrument!

Bond Testing instrument designed for automated testing applications.

Contact Us Today

 

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Bond Testing Instrument (BondScan™)

TecScan’s BondScan™ instrument is designed to be fully integrated to automated systems. The instrument is available as a desktop and rack mount instrument and designed to be easily integrated in systems for Automated Testing of complex parts.

With its advanced digital design, the instrument operates at a very stable time-base which is combined with the high frequency converters allowing real-time C-Scan bond testing. It works with our TecView® BT software for manual and advanced automated non-destructive testing. BondScan™ is designed with applicability in mind, with specifications that can meet the most challenging automated testing applications.

When used with the ARMANDA automated XY scanner, high-resolution C-Scan images can be generated from the detect signal amplitude and phase changes. This provides an accurate C-Scan representation of thickness changes caused by the presence of any disbonds in multi-layered laminate composites and with honeycomb sandwich cores.

Software Features:

  • Resonance testing
  • Imaging and Analysis module
  • Real-time impedance and C-Scan display
  • Live Alarms utilities
  • Post-processing re-nulling and rotations
  • Impedance components C-Scan imaging (amplitude, phase, etc.)
  • Phase information can be displayed as thickness C-Scan
  • Alarm based C-Scan imaging
  • 3D projection for better illustration of defects
  • Reporting capabilities
  • Intuitive user-interface & menu

BondScan™ Instrument Specifications

Analog output full scale±10V

Frequency 1 kHz to 1 MHz
Rotation 0 to 360 °, 0.1° steps
Output voltage 0 to 20 Vpp, 0.1V steps
Preamplifier 0 to 30 dB
Horizontal, Vertical gains 0 to 90 db, 0.1 dB steps
Low pass filter 1 Hz to 10 kHz
Analog outputs Horizontal
Vertical
External trigger input TTL compatible
Control interface USB
Digital data output 16 bit, streaming via USB
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1131 Rue Marie-Victorin
St-Bruno-de-Montarville, Quebec
Canada J3V 0M7
(1) 450.233.4973
(1) 450.233.4974

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